NMF Webinar - 05/07/24
The direct correlation of scanning electron microscopy (SEM) and atomic force microscopy (AFM) is a powerful analytical approach for acquiring complementary data on micro- and nanostructures. This combination offers new prospects for overcoming certain difficulties in measuring nanomaterials such as nanoplatelets, composites or blends. Our next webinar, scheduled for Friday July 5 from 11:00 to 11:4...






